Linear-defect-induced thermal instability in YBCO thin films in microwave fields

Journal of Superconductivity and Novel Magnetism

Volumn 16, Issue 5, 2003, Pages 889-894

  Pan, V M ^a   Tretiatchenko, C G ^a   Flis, V S ^a   Komashko, V A ^a   Kalenyuk, O A ^a   Pashitskii, E A ^b   Ivanyuta, A N ^c   Melkov, G A ^c   Zandbergen, H W ^d   Svetchnikov, V L ^d  

^a INSTITUTE OF METAL PHYSICS   (Ukraine)

^b INSTITUTE OF PHYSICS   (Ukraine)

^c TARAS SHEVCHENKO NATIONAL UNIVERSITY OF KYIV   (Ukraine)

^d DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Edge dislocations; Heat instability; High temperature superconducting epitaxial thin films; Microwave surface resistance

Indexed keywords

CURRENT DENSITY; DISLOCATIONS (CRYSTALS); HEAT TRANSFER; MATHEMATICAL MODELS; MICROWAVES; SEMICONDUCTOR MATERIALS; STOICHIOMETRY; THERMAL CONDUCTIVITY; YTTRIUM BARIUM COPPER OXIDES;

EDGE DISLOCATION; MICROWAVE SURFACE RESISTANCE; SURFACE IMPEDANCE; THERMAL INSTABILITY;

THIN FILMS;

EID: 3042727596     PISSN: 15571939     EISSN: 15571947     Source Type: Journal    
DOI: None     Document Type: Article

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