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Volumn 92, Issue 22, 2004, Pages
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Shot noise in linear macroscopic resistors
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
CARRIER MOBILITY;
CHARGE CARRIERS;
COULOMB BLOCKADE;
CURRENT VOLTAGE CHARACTERISTICS;
DIELECTRIC RELAXATION;
DIFFUSION;
ELECTRIC INSULATION;
ELECTRIC RESISTANCE;
ELECTRON SCATTERING;
ELECTRON TRANSITIONS;
PERMITTIVITY;
POTENTIAL ENERGY;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTING CADMIUM TELLURIDE;
SHOT NOISE;
BOLTZMANN CONSTANT;
COULOMB INTERACTIONS;
NYQUIST NOISE;
POTENTIAL ENERGY BARRIERS;
RESISTORS;
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EID: 3042718917
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.92.226601 Document Type: Article |
Times cited : (18)
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References (20)
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