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Volumn 125, Issue 7, 2004, Pages 1119-1125
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Structural and impedance studies on LaF3 thin films prepared by vacuum evaporation
c
KEIO UNIVERSITY
(Japan)
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Author keywords
Impedance spectroscopy; LaF3; Modulus analysis; XRD analysis
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Indexed keywords
FLUORIDE;
LANTHANUM;
ARTICLE;
CHEMICAL ANALYSIS;
CHEMICAL REACTION;
CHEMICAL STRUCTURE;
CONTROLLED STUDY;
CRYSTAL STRUCTURE;
ELECTRIC CONDUCTIVITY;
EVAPORATION;
FILM;
IMPEDANCE;
ION CONDUCTANCE;
STRUCTURE ANALYSIS;
TEMPERATURE DEPENDENCE;
VACUUM;
X RAY DIFFRACTION;
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EID: 3042688551
PISSN: 00221139
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jfluchem.2004.02.001 Document Type: Article |
Times cited : (34)
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References (22)
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