Electrochemically grown tin oxide thin films: In situ characterization of electronic properties and growth mechanism

Journal of Physical Chemistry B

Volumn 108, Issue 24, 2004, Pages 8173-8181

  Díaz, Raül ^a   Joiret, Suzanne ^b   Cuesta, Ángel ^c   Díez Pérez, Ismael ^a   Allongue, Philippe ^b,d   Gutiérrez, Claudio ^c   Gorostiza, Pau ^a   Sanz, Fausto ^a  

^a UNIVERSITY OF BARCELONA   (Spain)

^b Université Pierre et Marie Curie   (France)

^c INSTITUTO DE QUÍMICA FÍSICA ROCASOLANO   (Spain)

^d LABORATOIRE DE PHYSIQUE DE LA MATIÈRE CONDENSÉE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CYCLIC VOLTAMMETRY; ELECTROCHEMISTRY; GROWTH KINETICS; NANOSTRUCTURED MATERIALS; OXIDATION; PH EFFECTS; POLYCRYSTALLINE MATERIALS; RAMAN SCATTERING; REDUCTION; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; THIN FILMS;

ANODIC POTENTIALS; ELECTROCHEMICAL TRANSFER; OXIDATION POTENTIAL; POTENTIAL MODULATED REFLECTANCE SPECTROSCOPY (PMRS);

TIN COMPOUNDS;

EID: 3042685260     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp037530c     Document Type: Article

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