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Volumn 29, Issue 6, 2004, Pages

Charge transport through molecular junctions

Author keywords

Electrodes; Metals; Molecular electronics; Molecular transport junctions; Scanning probe microscopy; Semiconductors

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHARGE TRANSFER; ELECTROCHEMICAL ELECTRODES; LOW ENERGY ELECTRON DIFFRACTION; SEMICONDUCTOR JUNCTIONS; SEMICONDUCTOR MATERIALS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 3042683328     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2004.120     Document Type: Article
Times cited : (9)

References (56)
  • 54
    • 3042556879 scopus 로고    scopus 로고
    • T. Rakshit, G.-C. Liang, A.W. Ghosh, S. Datta, arXiv.org e-print archive, cond-mat/0305695 (accessed March 2004)
    • T. Rakshit, G.-C. Liang, A.W. Ghosh, and S. Datta, arXiv.org e-print archive, cond-mat/0305695 (accessed March 2004).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.