A new analytical inductance extraction technique of on-wafer spiral inductors

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2004, Pages 279-283

  Shima, Hideki ^a   Matsuoka, Toshimasa ^a   Taniguchi, Kenji ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPUTER SIMULATION; ELECTRIC POWER SYSTEM INTERCONNECTION; ELECTROMAGNETISM; INDUCTANCE; SILICON WAFERS; VLSI CIRCUITS;

ELECTROMAGNETIC SIMULATORS; SPIRAL INDUCTORS;

ELECTRIC INDUCTORS;

EID: 3042660050     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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