Characterization of self-assembling isolated ferroelectric domains by scanning force microscopy

Ultramicroscopy

Volumn 100, Issue 3-4, 2004, Pages 339-346

  Lee, Bongki ^a   Bae, Changdeuck ^a   Kim, Seung Hyun ^b   Shin, Hyunjung ^a  

^a Kookmin University   (South Korea)

^b INOSTEK Inc   (South Korea)

Author keywords

18

Indexed keywords

DEPOSITION; MICROSTRUCTURE; PHASE TRANSITIONS; SCANNING; SELF ASSEMBLY; SOL-GELS; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC DOMAINS; FERROELECTRIC PHASES; SCANNING FORCE MICROSCOPY;

FERROELECTRIC MATERIALS;

LEAD TITANATE ZIRCONATE; TITANIUM DERIVATIVE; UNCLASSIFIED DRUG; ZIRCONIUM DERIVATIVE;

CONFERENCE PAPER; FILM; PIEZOELECTRICITY; SCANNING FORCE MICROSCOPY; TECHNIQUE; TEMPERATURE;

EID: 3042656529     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2003.12.015     Document Type: Conference Paper

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