Experimental verification of SRAM cell functionality after hard and soft gate oxide breakdowns

European Solid-State Device Research Conference

Volumn , Issue , 2003, Pages 75-78

  Kaczer, B ^a   Degraeve, R ^a   Augendre, E ^a   Jurczak, M ^a   Groeseneken, G ^a,b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL VERIFICATION; SOFT GATE; SRAM CELL;

EID: 3042652187     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2003.1256814     Document Type: Conference Paper

References (19)

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