HREM: A useful tool to formulate new members of the wide Bi 3+/M2+ oxide phosphate series

Chemistry of Materials

Volumn 16, Issue 13, 2004, Pages 2628-2638

  Huvé, Marielle ^a   Colmont, Marie ^a   Mentré, Olivier ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; IMAGING TECHNIQUES; OXIDE MINERALS; POSITIVE IONS; X RAY DIFFRACTION;

HIGH RESOLUTION IMAGING; MULTIPHASED SAMPLES; POLYCATIONS; SINGLE-PHASED MATERIALS;

HIGH RESOLUTION ELECTRON MICROSCOPY;

BISMUTH; CADMIUM; CALCIUM ION; COPPER ION; LEAD; MAGNESIUM ION; METAL ION; OXIDE; PHOSPHATE; POLYCATION;

ARTICLE; CHEMICAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; HIGH RESOLUTION IMAGING; IMAGE PROCESSING; IMAGE QUALITY; IMAGE RECONSTRUCTION; IMAGING SYSTEM; MATERIALS; REACTION ANALYSIS; STRUCTURE ANALYSIS; SYNTHESIS; X RAY DIFFRACTION;

EID: 3042651445     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm040152j     Document Type: Article

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