Residual stress change of optical fiber for Ge dopant variation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5279, Issue , 2004, Pages 483-488

  Lee, Jae Ho ^a   Oh, Sung Koog ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

Annealing; GeO2 dopant concentration; Optical fiber; Photoelastic constant; Refractive index; Residual stress

Indexed keywords

ANNEALING; DOPING (ADDITIVES); FUSED SILICA; PHOTOELASTICITY; REFRACTIVE INDEX; RESIDUAL STRESSES; SEMICONDUCTING GERMANIUM COMPOUNDS;

GEO2 DOPANT CONCENTRATION; INDEX CHANGE; PHOTOELASTIC CONSTANT; STRESS MEASUREMENT;

OPTICAL FIBERS;

EID: 3042648038     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.520433     Document Type: Conference Paper

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