Conditions for the coincidence of the TFR, TRY and CE models

Statistical Papers

Volumn 45, Issue 3, 2004, Pages 393-412

  Wang, Ronghua ^a   Fei, Heliang ^a  

^a SHANGHAI NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3042644955     PISSN: 09325026     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02777579     Document Type: Article

References (10)

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3. DeGroot MH, Goel PK(1979) Bayesian estimation and optimal Designs in partially accelerated life testing. Naval Research logistics Quarterly, 26, 223-235
4. Fei H, Xun X(1996) Statistical Analysis for Progressive Stress Accelerated Life Testing in the Exponential Case. Proceedings of the Third International Conference on Reliability, Maintainability and Safety, Guangzhou, China, 420-425
5. Lin Z, Fei H(1987) Statistical Inference from Progressive Stress Accelerated Life Tests. Proceedings of China-Japan Reliability Symposium, Shanghai, China, 229-236
6. Madi MT(1993) Multiple Step-Stress Accelerated Life Test:The Tampered Failure Rate Model. Commun. Statist-Theory Meth. 22(9), 2631-2639
7. Nelson, W(1980) Accelerated life testing step-stress models and data analysis. IEEE Trans. on Reliability, 29, 103-108
8. Nelson, W(1990) Accelerated Testing. John Wiley &Sons, New York
9. Rao, BR(1992) Equivalence of the Tampered Random Variable and the Tampered Failure Rate Models in Accelerated Life Testing for a Class of Life Distributions Having the 'Setting the Clock Back to Zero Property'. Commun. Statist.-Theory Meth. 21(3), 647-664
10. Seiji Nabeya(1993) Coincidence of Two Failure Rate Models. Commun. Statist-Theory Meth. 22(3), 781-785