Neutron-induced SEU in bulk and SOI SRAMs in terrestrial environment

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2004, Pages 677-678

  Baggio, J ^a   Lambert, D ^a,c   Ferlet Cavrois, V ^a   D'hose, C ^a   Hirose, K ^b   Saito, H ^b   Palau, J M ^c   Saigne F ^c   Sagnes, B ^c   Buard, N ^d   Carriere T ^e  

^a CEA DIF   (France)

^b JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^c UNIVERSITÉ MONTPELLIER II   (France)

^d ADS CCR   (France)

^e AIRBUS GROUP INNOVATIONS   (Germany)

Author keywords

Neutron; SER; SOI FD

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; COSMIC RAYS; ELECTRIC CHARGE; ELECTRIC POTENTIAL; IONIZING RADIATION; MONTE CARLO METHODS; NEUTRONS;

PARASITIC BIPOLAR AMPLIFICATION; SINGLE EVENT PHENOMENON (SEP); SOFT ERROR RATE (SER);

STATIC RANDOM ACCESS STORAGE;

EID: 3042604387     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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