High performance, low-noise, 128-channel readout integrated circuit for flat panel x-ray detector systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5368, Issue 2, 2004, Pages 714-725

  Beuville, Eric ^a   Belding, Mark ^a   Costello, Adrienne ^a   Hansen, Randy ^a   Petronio, Susan ^b  

^a Indigo Systems Corporation   (United States)

^b Crested Butte Technologies Inc   (United States)

Author keywords

A D converter; ASIC; CMOS; Correlated double sampling; Digital x ray image; Integration time; Low pass filter; Multiplexing; Readout integrated circuit (ROIC); Thin film transistor (TFT)

Indexed keywords

A/D CONVERTERS; CORRELATED DOUBLE SAMPLING; DIGITAL X-RAY IMAGE; INTEGRATION TIME; READOUT INTEGRATED CIRCUITS (ROIC);

FLIP CHIP DEVICES; LOW PASS FILTERS; MAMMOGRAPHY; MEDICAL IMAGING; MULTIPLEXING; THIN FILM TRANSISTORS; X RAY ANALYSIS;

APPLICATION SPECIFIC INTEGRATED CIRCUITS;

EID: 3042600018     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.535842     Document Type: Conference Paper

References (4)

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