Electron impact ionization of C2H6: Ionization energies and temperature effects

International Journal of Mass Spectrometry

Volumn 235, Issue 2, 2004, Pages 155-162

  Vasekova E ^a   Stano, M ^a   Matejcik S ^a   Skalny J D ^a   Mach, P ^a   Urban, J ^a   Mark T D ^a,b  

^a Physics and Informatics   (Slovakia)

^b Austria   (Austria)

Author keywords

Appearance energies; Electron impact ionization; Ethane (C2H 6); Ionization energy

Indexed keywords

CARBON 11; HYDROGEN; ION;

ANALYTIC METHOD; ARTICLE; CALCULATION; CHEMICAL PROCEDURES; ELECTRON; ENERGY TRANSFER; GAS ANALYSIS; IONIZATION; QUANTUM CHEMISTRY; TEMPERATURE SENSITIVITY; THEORY;

EID: 3042539837     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2004.04.011     Document Type: Article

References (26)

1. R.K. Janev (Ed.), Atomic and Molecular Processes in Fusion Plasmas, Plenum, New York, 1995.
2. R.K. Janev, J.G. Wang, I. Murakami, T. Kato, Research report, NIFS Data Series, 2001, p. 68.
3. Stano M., Matejcik S., Skalny J.D., Märk T.D. J. Phys. B: At. Mol. Opt. Phys. 36:2003;261
4. Suzuki I.H., Maeda K. Int. J. Mass Spectrom. Ion Phys. 24:1977;147
5. Plessis P., Marmet P. Can. J. Chem. 65:1987;1424
6. Chatham H., Hils D., Robertson R., Gallagher A. J. Chem. Phys. 18:1984;1770
7. William J.M., Hamill W.H. J. Chem. Phys. 49:1968;4467
8. Selim E.T.M. Ind. J. Pure Appl. Phys. 14:1976;547
9. Mackie A., Sands A.M., Scully S.W.J., Holland D.M.P., Shaw D.A., Dunn K.F., Latimer C.J. J. Phys. B: At. Mol. Opt. Phys. 35:2002;1061
10. Chupka W., Berkowitz J. J. Chem. 47:1967;2921
11. Kameta K., Kouchi N., Ukai M., Hatano Y. J. Electron Spectrosc. Rel. Phenom. 123:2002;225
12. Nicholson A.J.C. J. Chem. Phys. 43:1965;1171
13. Matejcik S., Foltin V., Stano M., Skalny J.D. Int. J. Mass Spectrom. 223-224:2003;9
14. Stamatovic A., Schulz G. Rev. Sci. Instrum. 39:1968;1752
15. NIST Chemistry WebBook, http://webbook.nist.gov.
16. Weitzel K.-M. Int. J. Mass Spectrosc. Ion Process. 136:1994;1
17. Kurosaki Y., Takayanagi T. Chem. Phys. Lett. 277:1997;291
18. Jursic B.S. J. Mol. Struct. (Theochem). 452:1998;145
19. Curtiss L.A., Raghavachari K., Redfern P.C., Rassolov V., Pople J.A. J. Chem. Phys. 109:1998;7764
20. Baboul A.G., Curtiss L.A., Redfern P.C., Raghavachari K. J. Chem. Phys. 110:1999;7650
21. Ochterski J.W., Petersson G.A., Montgomery J.A. Jr. J. Chem. Phys. 104:1996;2598
22. J.A. Montgomery Jr., M.J. Frisch, J.W. Ochterski, G.A. Petersson, A complete basis set model chemistry. VI. Use of density functional geometries and frequencies, 1998, in preparation.
23. Cederbaum L.S. J. Phys. B8:1975;290
24. von Niessen W., Schirmer J., Cederbaum L.S. Comp. Phys. Rep. 1:1984;57
25. Pople J.A., Head-Gordon M., Raghavachari K. J. Chem. Phys. 87:1987;5968
26. M.J. Frisch, G.W. Trucks, H.B. Schlegel, G.E. Scuseria, M.A. Robb, J.R. Cheeseman, V.G. Zakrzewski, J.A. Montgomery, R.E. Stratmann, J.C. Burant, S. Dapprich, J.M. Millam, A.D. Daniels, K.N. Kudin, M.C. Strain, O. Farkas, J. Tomasi, V. Barone, M. Cossi, R. Cammi, B. Mennucci, C. Pomelli, C. Adamo, S. Clifford, J. Ochterski, G.A. Petersson, P.Y. Ayala, Q. Cui, K. Morokuma, D.K. Malick, A.D. Rabuck, K. Raghavachari, J.B. Foresman, J. Cioslowski, J.V. Ortiz, B.B. Stefanov, G. Liu, A. Liashenko, P. Piskorz, I. Komaromi, R. Gomperts, R.L. Martin, D.J. Fox, T. Keith, M.A. Al-Laham, C.Y. Peng, A. Nanayakkara, C. Gonzalez, M. Challacombe, P.M.W. Gill, B.G. Johnson, W. Chen, M.W. Wong, J.L. Andres, M. Head-Gordon, E.S. Replogle, J.A. Pople, Gaussian 98 (Revision A.11), Gaussian, Inc., Pittsburgh, PA, 1998.