Caractérisation d'empilements de couches minces par mesure de la réflectivité spéculaire des rayons X

Vide: Science, Technique et Applications

Volumn 2 4, Issue 304, 2002, Pages 387-429

  Durand, Olivier ^a  

^a Research Technology   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3042517036     PISSN: 12660167     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (21)

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