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Volumn 22, Issue 1, 2006, Pages 363-368

AFM study of defect-induced depressions of the smectic-A/air interface

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; NEMATIC LIQUID CRYSTALS; REFLECTION; TEMPERATURE MEASUREMENT;

EID: 30344485702     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0525224     Document Type: Article
Times cited : (48)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.