Thermal expansion and stability of cerium-doped Lu2SiO 5

Materials Research Bulletin

Volumn 41, Issue 2, 2006, Pages 423-435

  Speakman, Scott A ^a   Porter, Wallace D ^a   Spurrier, Merry A ^b   Melcher, Charles L ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

A. Optical materials; B. Crystal growth; C. X ray diffraction; D. Phase equilibria; D. Thermal expansion

Indexed keywords

CERIUM; CRYSTAL GROWTH; DIFFERENTIAL SCANNING CALORIMETRY; DILATOMETERS; LUTETIUM; OPTICAL MATERIALS; PHASE EQUILIBRIA; SCINTILLATION; THERMAL EXPANSION; THERMODYNAMIC STABILITY; X RAY DIFFRACTION;

BULK DEFECTS; CERIUM-DOPED LU2SIO 5; SCINTILLATION EFFICIENCY;

SILICA;

EID: 30344477947     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2005.08.006     Document Type: Article

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