Texture and surface analysis of thin-film GaAs on glass formed by pulsed-laser deposition

Journal of Non-Crystalline Solids

Volumn 352, Issue 2, 2006, Pages 193-196

  Erlacher, A ^a   Ullrich, B ^a   Komarova, E Y ^b   Jaeger, H ^c   Haugan, H J ^d   Brown, G J ^d  

^a BOWLING GREEN STATE UNIVERSITY   (United States)

^b Fractal Systems Inc   (United States)

^c MIAMI UNIVERSITY   (United States)

^d AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

Amorphous semiconductors; Atomic force and scanning tunneling microscopy; III V semiconductors X ray diffraction; Laser deposition; Microcrystallinity; Optical spectroscopy; Raman spectroscopy; Surfaces and interfaces; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; GLASS; PULSED LASER DEPOSITION; RAMAN SPECTROSCOPY; TEXTURES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

AMORPHOUS SEMICONDUCTORS; MICROCRYSTALLINITY; OPTICAL SPECTROSCOPY; SCANNING TUNNELING SPECTROSCOPY; SURFACES AND INTERFACES;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 30344465026     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.10.025     Document Type: Article

References (15)

1. H. Reuter, H. Schmitt, and M. Boeffgen Thin Solid Films 254 1995 96
2. U. Coscia, R. Murri, N. Pinto, and L. Trojani J. Non-Cryst. Solids 194 1996 103
3. M.F. Kotkata, K.M. Kandil, M.H. El-Fouly, and M.M. Ibrahim J. Non-Cryst. Solids 205-207 1996 176
4. J.H. Dias da Silva, and R.R. Campomanes J. Non-Cryst. Solids 299-302 2002 328
5. R.R. Campomanes, J.H. Dias da Silva, J. Vilcarromero, and L.P. Cardoso J. Non-Cryst. Solids 299-302 2002 788
6. S. Kalem, and B. Jusserand Appl. Phys. A 62 1996 237
7. D.L. Smith Thin-film Deposition, Principles & Practice 1995 McGraw-Hill, Inc. New York p. 394
8. V.S. Ban, and D.A. Kramer J. Mat. Sci. 5 1970 978
9. B. Ullrich, A. Erlacher, S. Yano, R. Schroeder, T.G. Gerasimov, and H.J. Haugan Proc. SPIE 4977 2003 180
10. A. Erlacher, M. Ambrico, V. Capozzi, V. Augelli, H. Jaeger, and B. Ullrich Semicond. Sci. Technol. 19 2004 1322
11. A. Erlacher, and B. Ullrich Semicond. Sci. Technol. 19 2004 L9
12. B. Ullrich, A. Erlacher, and E.O. Danilov Semicond. Sci. Technol. 19 2004 L111
13. B.D. Cullity Elements of X-ray Diffraction 1956 Addison-Wesley Reading p. 262
14. F.H. Pollak J.G. Grasselli B.J. Bulkin Analytical Raman Spectroscopy 1991 Wiley New York 137
15. L.N. Dinh, S.E. Hayes, A.E. Wynne, M.A. Wall, C.K. Saw, B.C. Stuart, M. Balooch, A.K. Paravastu, and J.A. Reimer J. Mater. Sci. 37 2002 3953