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Volumn 31, Issue 3, 2005, Pages 960-963

The use of Relative Response Factors to determine impurities

Author keywords

[No Author keywords available]

Indexed keywords


EID: 30344459948     PISSN: 03634655     EISSN: 15421945     Source Type: Journal    
DOI: None     Document Type: Review
Times cited : (11)

References (4)
  • 1
    • 33748935357 scopus 로고    scopus 로고
    • An approach to the metrologically sound traceable assessment of the chemical purity of organic reference materials
    • Gaithersburg, MD: National Institute of Standards and Technology
    • Duewer DL, Parria RM, White EV, May WE, Elbaum H. An Approach to the Metrologically Sound Traceable Assessment of the Chemical Purity of Organic Reference Materials. NIST Special Publication 1012. Gaithersburg, MD: National Institute of Standards and Technology; 2004:6.
    • (2004) NIST Special Publication 1012 , pp. 6
    • Duewer, D.L.1    Parria, R.M.2    White, E.V.3    May, W.E.4    Elbaum, H.5
  • 4
    • 33746592288 scopus 로고    scopus 로고
    • Strasbourg, France: EDQM
    • th ed. Strasbourg, France: EDQM; 2005. 72-73.
    • (2005) th Ed. , pp. 72-73


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.