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Volumn 497, Issue 1-2, 2006, Pages 177-181
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Nanocrystalline Sr2CeO4 thin films grown on silicon by laser ablation
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Author keywords
Laser ablation; Luminescence; Transmission electron microscopy; X ray diffraction
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Indexed keywords
ELECTRON DIFFRACTION;
LASER ABLATION;
NANOSTRUCTURED MATERIALS;
PHOTOLUMINESCENCE;
STRONTIUM COMPOUNDS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
CRYSTALLOGRAPHIC ORIENTATION;
OXYGEN PRESSURE;
SILICON SUBSTRATES;
THIN FILMS;
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EID: 30344435274
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2005.11.005 Document Type: Article |
Times cited : (9)
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References (16)
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