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Volumn 497, Issue 1-2, 2006, Pages 177-181

Nanocrystalline Sr2CeO4 thin films grown on silicon by laser ablation

Author keywords

Laser ablation; Luminescence; Transmission electron microscopy; X ray diffraction

Indexed keywords

ELECTRON DIFFRACTION; LASER ABLATION; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 30344435274     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.11.005     Document Type: Article
Times cited : (9)

References (16)
  • 3
    • 0037997768 scopus 로고
    • Joint Committee on Powder Diffraction Standards, ASTM, Philadelpia, PA, Card 50-0115
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards, ASTM, Philadelpia, PA, 1967, Card 50-0115.
    • (1967) Powder Diffraction File


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.