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Physical Review B

Volumn 37, Issue 5, 1988, Pages 2450-2464

Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure

(4) Erbil, A a Cargill Iii, G S a Frahm, R a Boehme, R F a

a IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 30244566758 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.37.2450 Document Type: Article

Times cited : (246)

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