Charge-collection and trapping effects in cryogenic silicon detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 370, Issue 1, 1996, Pages 215-217

  Penn, M J ^a   Dougherty, B L ^a   Cabrera, B ^a   Young, B A ^b  

^a STANFORD UNIVERSITY   (United States)

^b SANTA CLARA UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 30244565271     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(95)01122-6     Document Type: Article

References (9)

1. See B. Cabrera, these Proceedings (Workshop on Low Temperature Detectors (LTD6), Beatenberg/Interlaken, Switzerland, 1995) Nucl. Instr. and Meth. A 370 (1996) 150.
2. K.D. Irwin, Appl. Phys. Lett. 66 (1995) 1998; K.D. Irwin, Ph.D. thesis, Stanford University (1995), unpublished.
3. K.D. Irwin, Appl. Phys. Lett. 66 (1995) 1998; K.D. Irwin, Ph.D. thesis, Stanford University (1995), unpublished.
4. M.J. Penn, B.L. Dougherty, B. Cabrera and D.L. Sisson, Nucl. Instr. and Meth. A 364 (1995) 118.
5. M.J. Penn, B.L. Dougherty and B. Cabrera, Proc. 5th Int. Workshop on Low-Temperature Detectors, Berkeley, CA, USA, 29 July-3 Aug. 1993, J. Low Temp. Phys. 93 (1993) 423.
6. M.J. Penn, B.L. Dougherty, B. Cabrera and B.A. Young, to be submitted to Nucl. Instr. and Meth. A.
7. B.L. Dougherty et al., Nucl. Instr. and Meth. A 333 (1993) 464.
8. For neutral impurity scattering see R.A. Smith, Semiconductors, 2nd ed. (Cambridge University Press, London, 1978). For estimates of trapping cross sections see T. Shutt, et al., Phys. Rev. Lett. 69 (1992) 3531.
9. For neutral impurity scattering see R.A. Smith, Semiconductors, 2nd ed. (Cambridge University Press, London, 1978). For estimates of trapping cross sections see T. Shutt, et al., Phys. Rev. Lett. 69 (1992) 3531.