Modularizing, Minimizing, and Interpreting the K&H Fault-Tree

IEEE Transactions on Reliability

Volumn R-30, Issue 5, 1981, Pages 411-415

  Locks, Mitchell O ^a  

^a OKLAHOMA STATE UNIVERSITY   (United States)

Author keywords

Boolean methods; Consensus; Duality; Fail safe; Fault tree; Minimization; Modularization; Prime implicant; s Noncoherence

Indexed keywords

EID: 30244555134     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.1981.5221150     Document Type: Article

References (20)

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