X-ray diffraction from mesoscopic systems: Thin films on ‘rough’ surfaces

Journal of Physics D: Applied Physics

Volumn 28, Issue 4, 1995, Pages A231-A235

  Tolan, M ^a   Vacca, G ^b   Sinha, S K ^b   Li, Z ^c   Rafailovich, M ^c   Sokolov, J ^c   Lorenz, H ^d   Kotthaus, J P ^d  

^a UNIVERSITY OF KIEL   (Germany)

^b EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

^c STONY BROOK UNIVERSITY   (United States)

^d UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; POLYMER FILMS; SEMICONDUCTING FILMS; VAN DER WAALS FORCES;

EXIT ANGLES; MESOSCOPIC SYSTEMS; STRUCTURED SURFACES; SURFACE GRATING; THIN POLYSTYRENE FILMS; VAN DER WAALS INTERACTIONS; X RAY DATA; X-RAY DIFFRACTION MEASUREMENTS;

X RAY DIFFRACTION;

EID: 30244509609     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/28/4A/045     Document Type: Article

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