Soft x-ray emission of porous silicon nanostructures

Journal of Electron Spectroscopy and Related Phenomena

Volumn 79, Issue , 1996, Pages 135-138

  Eisebitt, S ^a,b   Luning J ^a   Rubensson, J E ^a   Van Buuren, T ^b   Patitsas, S N ^b   Tiedje, T ^b   Berger, M ^a   Arens Fischer, R ^a   Frohnhoff, S ^a   Eberhardt, W ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 30244493401     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/0368-2048(96)02820-4     Document Type: Article

References (10)

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2. C. Larsson, A. Beutler, O. Björneholm, F. Federmann, U. Hahn, A. Rieck, S. Verbin, and T. Möller, Nucl. Inst. Meth. A 6 1172 (1994).
3. T. van Buuren, T. Tiedje, S.N. Patitsas, and C. D. W. Jones, Proc. 22nd Intl. Conf. Phys. Semicond. (World Scientific, 1994) p. 2125.
4. M. Jeske, K.G. Jung, J.W. Schulze, M. Thönissen, and H. Münder, Surf. Interface Anal. 22 363, (1994).
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6. T. Åberg and B. Crasemann, in: Resonant Anomalous X-Ray Scattering, p.431 (North Holland, 1994).
7. Y. Ma, Phys. Rev. B 49, 5799 (1994).
8. S. Eisebitt, J. Lüning, J.-E. Rubensson, S.N. Patitsas, T. Tiedje, and W. Eberhardt, in preparation.
9. T. Ito and A. Hiraki, J. Luminesc. 57, 331 (1993).
10. S. Eisebitt, S.N. Patitsas, T. Tiedje, T. van Buuren, J. Lüning, J.-E. Rubensson, and W. Eberhardt, in preparation.