Study of the de Vries phase in new organosiloxanes by electrooptical and UV/V is spectroscopy measurements

Ferroelectrics

Volumn 309-312, Issue , 2004, Pages

  Panarin, Yu P ^a,b   Antonelli, F ^b   Panarina, O E ^b   Semenova, Yu ^a   Vij, J K ^b   Reihmann, M ^c   Galli, G ^c  

^a DUBLIN INSTITUTE OF TECHNOLOGY   (Ireland)

^b TRINITY COLLEGE DUBLIN   (Ireland)

^c UNIVERSITY OF PISA   (Italy)

Author keywords

Birefringence; Critical behavior; De Vries smectic; Electroclinic; Organosiloxane

Indexed keywords

BIREFRINGENCE; CRYSTALLINE MATERIALS; SPECTROSCOPIC ANALYSIS; ULTRAVIOLET RADIATION;

CRITICAL BEHAVIOR; DE VRIES MATERIALS; ELECTROCLINICAL; ORGANOSILOXANES;

ELECTROOPTICAL DEVICES;

EID: 30144444848     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190490510483     Document Type: Conference Paper

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