A neural network model of nitrogen stress assessment using a multispectral corn nitrogen deficiency sensor

ASAE Annual International Meeting 2004

Volumn , Issue , 2004, Pages 953-962

  Noh, Hyun Kwon ^a   Zhang, Qin ^a   Han, Shufeng ^b  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b Deere and Company   (United States)

Author keywords

Leaf reflectance; Multispectral image; Nitrogen deficiency sensing; Precision crop management; SPAD value estimation

Indexed keywords

CORRELATION METHODS; CROPS; NITROGEN; PERFORMANCE; STRESS ANALYSIS;

LEAF REFLECTANCE; MULTISPECTRAL IMAGING; NITROGEN DEFICIENCY SENSING; PRECISION CROP MANAGEMENT; SPAD VALUE ESTIMATION;

NEURAL NETWORKS;

CORRELATION; FARM CROPS; NEURAL NETWORKS; NITROGEN; PERFORMANCE; STRESS ANALYSIS;

EID: 30044438223     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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