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Volumn 54, Issue 12, 2005, Pages 5901-5906
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Fabrication and properties of the Y-doped Al2O3 high-k gate dielectric films
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Author keywords
Doped Al2O3; High k gate dielectric; Reactive radio frequency sputtering
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Indexed keywords
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EID: 30044435824
PISSN: 10003290
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (5)
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References (9)
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