Capture cross-section of hole traps in reoxidized nitrided oxide measured by irradiation

Solid State Electronics

Volumn 38, Issue 10, 1995, Pages 1851-1853

  Mallik, A ^a   Chandorkar, A N ^a   Vasi, J ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 29944447737     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(95)00086-9     Document Type: Article

References (12)

1. Interface-state generation under radiation and high-field stressing in reoxidized nitrided oxide MOS capacitors
2. Avalanche Injection of Holes into SiO2