Residual stress profile determined by piezo-spectroscopy in alumina/alumina-zirconia layers separated by a compositionally graded intermediate layer

Key Engineering Materials

Volumn 290, Issue , 2005, Pages 328-331

  Popa, Mónica ^a   Moreno, José M Calderón ^a   Hvizdoš, Pavol ^a   Bermejo, Raúl ^a   Anne, Guy ^b  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Compositionally graded layer; Electrophoretic deposition; Piezo spectroscopy; Residual stress; Ruby R line luminiscence; Zirconia alumina layered composites

Indexed keywords

ALUMINA; ELECTROPHORESIS; FLUORESCENCE; RESIDUAL STRESSES; THERMAL EXPANSION; ZIRCONIA;

COMPOSITIONALLY GRADED LAYERS; ELECTROPHORETIC DEPOSITION; PIEZO SPECTROSCOPY; RUBY R-LINE LUMINISCENCE; ZIRCONIA ALUMINA LAYERED COMPOSITES;

COMPOSITE MATERIALS;

EID: 29944442942     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-973-3.328     Document Type: Conference Paper

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