Measurement of wavefront phase delay and optical density in apodized coronagraphic mask materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5905, Issue , 2005, Pages 1-10

  Halverson, Peter G ^a   Ftaclas, Michael Z ^a   Balasubramanian, Kunjithapatham ^a   Hoppe, Daniel J ^a   Wilson, Daniel W ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Coronagraph occulting mask; Ellipsometry; Exoplanet detection; Extrasolar planet detection; Gray scale photomask; High Energy Beam Sensitive (HEBS) glass; Neutral density pattern; Optical constants; Wavefront phase delay

Indexed keywords

CORONAGRAPH OCCULTING MASKS; EXOPLANET DETECTION; EXTRASOLAR PLANET DETECTION; GRAY SCALE PHOTOMASK; HIGH ENERGY BEAM SENSITIVE (HEBS) GLASS; NEUTRAL DENSITY PATTERN; OPTICAL CONSTANTS; WAVEFRONT PHASE DELAY;

ASTRONOMY; ELLIPSOMETRY; LIGHT ABSORPTION; OPTICAL DEVICES; OPTICAL PROPERTIES; PLANETS;

SPACE RESEARCH;

EID: 29844447398     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.618530     Document Type: Conference Paper

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