Results from a contamination experiment on the ISS

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5900, Issue , 2005, Pages 1-12

  Friedrich, Peter ^a   Predehl, Peter ^a   Meidinger, Norbert ^a   Strüder, Lothar ^a   Vongehr, Monika ^a   Burkert, Wolfgang ^a   Freyberg, Michael ^a   Hartner, Gisela ^a   Bräuninger, Heinrich ^a   Hasinger, Günther ^a   Hofer, Stefan ^b   Stuffler, Timo ^b   Hagl, Franz ^c   Hollerith, Christian ^c  

^a MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^b OHB SYSTEM AG   (Germany)

^c INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONTAMINATION; DETECTORS; ELECTRON SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; MIRRORS; REFLECTION; SCANNING ELECTRON MICROSCOPY; X RAY APPARATUS;

SILICON DETECTORS; X-RAY INSTRUMENTATION; X-RAY MIRROR SURFACES;

SPACE STATIONS;

EID: 29844442614     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.616948     Document Type: Conference Paper

References (2)

1. Carpenter, J. D., Stevenson, T. J., Fraser, G. W., Lapington, J. S., Brandt, D., "Dust detection in the ISS environment using filmed microchannel plates", 2005, Journal of Geophys. Res., 110, E05013
2. Hofer, S., "X-Ray Mirror Expose Experiment on ISS, Summary Report", 2004, Kayser-Threde report Expose-KT-RP-001