-
1
-
-
0029701222
-
Design of a fault tolerant 100 gbits solid-state mass memory for satellites
-
Kluth, M. P., Simon, F. Le Gall, J. Y., and Muller, E. Design of a fault tolerant 100 gbits solid-state mass memory for satellites. In Proceedings of 14th VLSI Test Symposium, 1996, 281-286.
-
(1996)
Proceedings of 14th VLSI Test Symposium
, pp. 281-286
-
-
Kluth, M.P.1
Simon, F.2
Le Gall, J.Y.3
Muller, E.4
-
2
-
-
84929007103
-
Fault-tolerance of spacebome semiconductor mass memories
-
Fichna, T., Gartner, M., Gliem, F., and Rombeck, F. Fault-tolerance of spacebome semiconductor mass memories. In Twenty-Eighth Annual International Symposium on Fault-Tolerant Computing, Digest of Papers, 1998, 408-413.
-
(1998)
Twenty-Eighth Annual International Symposium on Fault-Tolerant Computing, Digest of Papers
, pp. 408-413
-
-
Fichna, T.1
Gartner, M.2
Gliem, F.3
Rombeck, F.4
-
3
-
-
0031628565
-
Suitability of cots ibm 64mb dram in space
-
Fox, J., Abare, W. E., and Ross, A. Suitability of cots ibm 64mb dram in space. In Proceedings of Fourth European Conference on Radiation and Its Effects on Components and Systems (RADECS 97), 1997, 240-244.
-
(1997)
Proceedings of Fourth European Conference on Radiation and Its Effects on Components and Systems (RADECS 97)
, pp. 240-244
-
-
Fox, J.1
Abare, W.E.2
Ross, A.3
-
4
-
-
0034206508
-
Observations on the reliability of cots-device-based solid state data recorders operating in low-Earth orbit
-
(June)
-
Underwood, C. I., and Oldfield, M. K. Observations on the reliability of cots-device-based solid state data recorders operating in low-Earth orbit. IEEE Transactions on Nuclear Science, 47, 4 (June 2000), 647-653.
-
(2000)
IEEE Transactions on Nuclear Science
, vol.47
, Issue.4
, pp. 647-653
-
-
Underwood, C.I.1
Oldfield, M.K.2
-
5
-
-
0742319579
-
Spacewire: The standard
-
vol (ESA SP-447) (ISBN 92 9092 788 7)
-
Parkes, S. M. Spacewire: The standard. In DASIA'99, 1999, vol. (ESA SP-447) (ISBN 92 9092 788 7), 111-116.
-
(1999)
DASIA'99
, pp. 111-116
-
-
Parkes, S.M.1
-
6
-
-
0034509287
-
A fault-tolerant 176 gbit solid state mass memory architecture
-
Cardarilli, G. C., Marinucci, P., Ottavi, M., and Salsano, A. A fault-tolerant 176 gbit solid state mass memory architecture. In Proceedings of the International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT '00), 2000, 173-180.
-
(2000)
Proceedings of the International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT '00)
, pp. 173-180
-
-
Cardarilli, G.C.1
Marinucci, P.2
Ottavi, M.3
Salsano, A.4
-
7
-
-
0027875525
-
Total dose failures in advanced electronics from single ions
-
(Dec.)
-
Oldham, T. R., Bennett, K. W., Beaucour, J., Carriere, T., Polvey, C., and Garnier, P. Total dose failures in advanced electronics from single ions. IEEE Transactions on Nuclear Science, 40, 6 (Dec. 1993), 1820-1830.
-
(1993)
IEEE Transactions on Nuclear Science
, vol.40
, Issue.6
, pp. 1820-1830
-
-
Oldham, T.R.1
Bennett, K.W.2
Beaucour, J.3
Carriere, T.4
Polvey, C.5
Garnier, P.6
-
8
-
-
0032097341
-
Radiation effects in advanced microelectronics technologies
-
(June)
-
Johnston, A. H. Radiation effects in advanced microelectronics technologies. IEEE Transactions on Nuclear Science, 45, 3 (June 1998), 1339-1354.
-
(1998)
IEEE Transactions on Nuclear Science
, vol.45
, Issue.3
, pp. 1339-1354
-
-
Johnston, A.H.1
-
9
-
-
29844439284
-
-
European Space Agency SpaceWire Homepage
-
European Space Agency SpaceWire Homepage: http://www.estec.esa.nl/tech/ spacewire/index.html.
-
-
-
-
10
-
-
0742284709
-
ESA developments in solid sate mass memories
-
(ESA Publication Division), (June)
-
Maeusli, D., Teston, F., Vuilleumier, P., and Harboe-Sorensen, R. ESA developments in solid sate mass memories. Preparing for the Future, (ESA Publication Division), 5, 2 (June 1995).
-
(1995)
Preparing for the Future
, vol.5
, Issue.2
-
-
Maeusli, D.1
Teston, F.2
Vuilleumier, P.3
Harboe-Sorensen, R.4
-
11
-
-
29844443605
-
-
MIL-STD-1553
-
MIL-STD-1553.
-
-
-
-
12
-
-
0031996751
-
Cosmic ray soft error rates of 16-mb dram memory chips
-
(Feb.)
-
Ziegler, J. F., and Nelson, M. E., et al. Cosmic ray soft error rates of 16-mb dram memory chips IEEE Journal of Solid-State Circuits, 33, 2 (Feb. 1998).
-
(1998)
IEEE Journal of Solid-State Circuits
, vol.33
, Issue.2
-
-
Ziegler, J.F.1
Nelson, M.E.2
-
13
-
-
0033334978
-
Failure tests on 64mb sdram in radiation environment
-
Bertazzoni, S., Cardarilli, G. C., Di Giovenale, D., Grande, G. C., Piergentili, D., Salmeri, M., Salsano, A., and Sperandei, S. Failure tests on 64mb sdram in radiation environment. In Proceedings of the International Symposium on Defect and Fault Tolerance in VLSI Systems, (DFT '99), 1999, 158-164.
-
(1999)
Proceedings of the International Symposium on Defect and Fault Tolerance in VLSI Systems, (DFT '99)
, pp. 158-164
-
-
Bertazzoni, S.1
Cardarilli, G.C.2
Di Giovenale, D.3
Grande, G.C.4
Piergentili, D.5
Salmeri, M.6
Salsano, A.7
Sperandei, S.8
-
16
-
-
0033100435
-
A new scalable VLSI architecture for Reed-Solomon decoders
-
(Mar.)
-
Wilhelm, W. A new scalable VLSI architecture for Reed-Solomon decoders. IEEE Journal of Solid-State Circuits, 34 (Mar. 1999), 388-396.
-
(1999)
IEEE Journal of Solid-State Circuits
, vol.34
, pp. 388-396
-
-
Wilhelm, W.1
-
17
-
-
0031276427
-
An area-efficient VLSI architecture of a Reed-Solomon decoder/encoder for digital VCRs
-
(Nov.)
-
Kwon, S., and ShinDept, H. An area-efficient VLSI architecture of a Reed-Solomon decoder/encoder for digital VCRs. IEEE Transactions on Consumer Electronics, 43 (Nov. 1997), 1019-1027.
-
(1997)
IEEE Transactions on Consumer Electronics
, vol.43
, pp. 1019-1027
-
-
Kwon, S.1
ShinDept, H.2
-
18
-
-
0023961238
-
Concurrent error detection using watchdog processors - A survey
-
(Feb.)
-
Mahmood, A., and McCluskey, E. J. Concurrent error detection using watchdog processors - A survey. IEEE Transactions on Computers, 37, 2 (Feb. 1988), 160-174.
-
(1988)
IEEE Transactions on Computers
, vol.37
, Issue.2
, pp. 160-174
-
-
Mahmood, A.1
McCluskey, E.J.2
-
19
-
-
0031121686
-
Parallel signature analysis design with bounds on aliasing
-
(Apr.)
-
Saxena, N. R., and McCluskey, E. J. Parallel signature analysis design with bounds on aliasing. IEEE Transactions on Computers, 46, 4 (Apr. 1997), 425-438.
-
(1997)
IEEE Transactions on Computers
, vol.46
, Issue.4
, pp. 425-438
-
-
Saxena, N.R.1
McCluskey, E.J.2
-
20
-
-
0033720592
-
Development of an evaluation model for the design of fault-tolerant solid state mass memory
-
May
-
Cardarilli, G. C., Marinucci, P., and Salsano, A. Development of an evaluation model for the design of fault-tolerant solid state mass memory. In Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS2000), vol. 2, May 2000, 673-676.
-
(2000)
Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS2000)
, vol.2
, pp. 673-676
-
-
Cardarilli, G.C.1
Marinucci, P.2
Salsano, A.3
-
21
-
-
29844452164
-
-
MIL-HDBK 338 B-6.3.5
-
MIL-HDBK 338 B-6.3.5.
-
-
-
-
22
-
-
0742324992
-
Design of a fault tolerant solid state mass memory
-
(Dec.)
-
Cardarilli, G. C., Leandri, A., Marinucci, P., Ottavi, M., Pontarelli, S., Re, M., and Salsano, A. Design of a fault tolerant solid state mass memory. IEEE Transactions on Reliability, 52, 4 (Dec. 2003). 476-491.
-
(2003)
IEEE Transactions on Reliability
, vol.52
, Issue.4
, pp. 476-491
-
-
Cardarilli, G.C.1
Leandri, A.2
Marinucci, P.3
Ottavi, M.4
Pontarelli, S.5
Re, M.6
Salsano, A.7
-
23
-
-
0742301996
-
Approximating the protection offered by a channel code in terms of bit error rate
-
Rhodes, Greece
-
Labeau, F., Desset, C., Macq, B., and Vandendorpe, L. Approximating the protection offered by a channel code in terms of bit error rate. In Proceedings of the European Signal Processing Conference, Rhodes, Greece, 1999.
-
(1999)
Proceedings of the European Signal Processing Conference
-
-
Labeau, F.1
Desset, C.2
Macq, B.3
Vandendorpe, L.4
-
24
-
-
0025419560
-
Reliability of scrubbing recovery-techniques for memory systems
-
(Apr.)
-
Saleh, A. M., Serrano, J. J., and Patel, J. H. Reliability of scrubbing recovery-techniques for memory systems. IEEE Transactions on Reliability, 39 (Apr. 1990), 114-122.
-
(1990)
IEEE Transactions on Reliability
, vol.39
, pp. 114-122
-
-
Saleh, A.M.1
Serrano, J.J.2
Patel, J.H.3
-
25
-
-
0038757965
-
A fault tolerant hardware based file system manager for solid state mass memory
-
Cardarilli, G. C., Ottavi, M., Pontarelli, S., and Salsano, A. A fault tolerant hardware based file system manager for solid state mass memory. In Proceedings of the 2003 International Symposium on Circuits and Systems (ISCAS 2003), vol. 5, V-649-V-652.
-
Proceedings of the 2003 International Symposium on Circuits and Systems (ISCAS 2003)
, vol.5
-
-
Cardarilli, G.C.1
Ottavi, M.2
Pontarelli, S.3
Salsano, A.4
-
26
-
-
0019047765
-
On evaluating the performability of degradable computing systems
-
(Aug.)
-
Meyer, J. F. On evaluating the performability of degradable computing systems. IEEE Transactions on Computers, C-29 (Aug. 1980), 720-731.
-
(1980)
IEEE Transactions on Computers
, vol.C-29
, pp. 720-731
-
-
Meyer, J.F.1
-
28
-
-
0035202381
-
Comparison and application of different vhdl-based fault injection techniques
-
Gracia, J., Baraza, J. C., Gil, D., and Gil, P. J. Comparison and application of different vhdl-based fault injection techniques. In Proceedings of International Symposium on Defect and Fault Tolerance in VLSI Systems, 2001, 233-241.
-
(2001)
Proceedings of International Symposium on Defect and Fault Tolerance in VLSI Systems
, pp. 233-241
-
-
Gracia, J.1
Baraza, J.C.2
Gil, D.3
Gil, P.J.4
-
29
-
-
0002475610
-
New techniques for accelerating fault injection in VHDL descriptions
-
Parrotta, B., Rebaudengo, M., Reorda, M. S., and Violante, M. New techniques for accelerating fault injection in VHDL descriptions. In Proceedings of 6th IEEE International On-Line Testing Workshop, 2000, 61-66.
-
(2000)
Proceedings of 6th IEEE International On-Line Testing Workshop
, pp. 61-66
-
-
Parrotta, B.1
Rebaudengo, M.2
Reorda, M.S.3
Violante, M.4
-
30
-
-
0028018774
-
Fault injection into VHDL models: The mefisto tool
-
Austin, TX, June
-
Jenn, E., Arlat, J., Rimen, M., Ohlsson, J., and Karlsson, J. Fault injection into VHDL models: The mefisto tool. In Proceedings of 24th International Fault Tolerant Computing Symposium (FTCS-24), Austin, TX, June 1994, 66-75.
-
(1994)
Proceedings of 24th International Fault Tolerant Computing Symposium (FTCS-24)
, pp. 66-75
-
-
Jenn, E.1
Arlat, J.2
Rimen, M.3
Ohlsson, J.4
Karlsson, J.5
-
31
-
-
84962664102
-
Bit flip injection in processor-based architectures: A case study
-
Isle of Bendor, France, July
-
Cardarilli, G. C., Kaddour, F., Leandri, A., Ottavi, M., Pontarelli, S., and Velazco, R. Bit flip injection in processor-based architectures: A case study. In Proceedings of 8th IEEE International On-Line Testing Workshop (IOLTW02), Isle of Bendor, France, July 2002.
-
(2002)
Proceedings of 8th IEEE International On-Line Testing Workshop (IOLTW02)
-
-
Cardarilli, G.C.1
Kaddour, F.2
Leandri, A.3
Ottavi, M.4
Pontarelli, S.5
Velazco, R.6
-
32
-
-
37249086232
-
Cyclone - A multipurpose heavy ion, proton and neutron see test site
-
Berger, G., Ryckewaert, G., Harboe-Sorensen, R., and Adams, L. Cyclone - A multipurpose heavy ion, proton and neutron see test site. In RADECS Radiation and its effects on Components and Systems.
-
RADECS Radiation and Its Effects on Components and Systems
-
-
Berger, G.1
Ryckewaert, G.2
Harboe-Sorensen, R.3
Adams, L.4
-
33
-
-
29844438987
-
-
Aldec, Inc. Active-HDL, Apr.
-
Aldec, Inc. Active-HDL, VHDL Reference Guide, Apr. 2001.
-
(2001)
VHDL Reference Guide
-
-
-
34
-
-
29844458455
-
A methodology for program-flow checking in microcontrollers: Checker design and performance evaluation
-
Internal report, available upon request
-
Ottavi, M., Pontarelli, S., Re, M., Salsano, A., Cardarilli, G. C., and Leandri, A. A methodology for program-flow checking in microcontrollers: Checker design and performance evaluation. Internal report, available upon request.
-
-
-
Ottavi, M.1
Pontarelli, S.2
Re, M.3
Salsano, A.4
Cardarilli, G.C.5
Leandri, A.6
-
35
-
-
29844448614
-
-
National Semiconductors Inc. Homepage
-
National Semiconductors Inc. Homepage:http://www.national.com.
-
-
-
-
36
-
-
29844442352
-
-
Xilinx Inc. Homepage
-
Xilinx Inc. Homepage:http://www.xilinx.com.
-
-
-
-
37
-
-
29844456804
-
-
The Dini Group Homepage
-
The Dini Group Homepage:http://www.dinigroup.com.
-
-
-
|