Long crack R-curve of aligned porous silicon nitride

Journal of the American Ceramic Society

Volumn 88, Issue 2, 2005, Pages 462-465

  Deng, Zhen Yan ^a   Inagaki, Yoshiaki ^b   She, Jihong ^c   Tanaka, Yoshihisa ^a   Liu, Yu Fu ^a   Sakamoto, Masao ^a   Ohji, Tatsuki ^c,d  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b Fine Ceramics Research Association   (Japan)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^d AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEVRON-NOTCHED BEAM TECHNIQUE; POROUS SILICON NITRIDES;

CRACKS; GROWTH (MATERIALS); MICROSTRUCTURE; POROUS SILICON; WAKES;

SILICON NITRIDE;

EID: 29744458765     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2005.00067.x     Document Type: Article

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