Surface conductive layers on oxidized (111) diamonds

Applied Physics Letters

Volumn 87, Issue 26, 2005, Pages 1-3

  Ri, Sung Gi ^b   Takeuchi, Daisuke ^b   Kato, Hiromitsu ^b   Ogura, Masahiko ^b   Makino, Toshiharu ^b   Yamasaki, Satoshi ^b   Okushi, Hideyo ^b   Rezek, Bohuslav ^a   Nebel, Christoph E ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

DIAMOND FILMS; HALL EFFECT DEVICES; HYDROGEN; OXIDATION; SURFACE STRUCTURE; THERMOANALYSIS;

HALL EFFECT MEASUREMENTS; HYDROGEN TERMINATION; OXIDIZED DIAMONDS; SURFACE CONDUCTIVE LAYERS (SCL);

CONDUCTIVE FILMS;

EID: 29744445496     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2158020     Document Type: Article

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