A hybrid knowledge discovery model using decision tree and neural network for selecting dispatching rules of a semiconductor final testing factory

Production Planning and Control

Volumn 16, Issue 7, 2005, Pages 665-680

  Wang, K J ^a   Chen, J C ^b   Lin, Y S ^b  

^a NATIONAL DONG HWA UNIVERSITY   (Taiwan)

^b CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

Author keywords

Decision tree; Dispatching rules; Neural network; Operations management

Indexed keywords

DECISION TREES; DISPATCHING RULES; EARLIEST-DUE-DATE (EDD) RULES; OPERATIONS MANAGEMENT;

BACKPROPAGATION; COMPUTER SIMULATION; DECISION MAKING; INDUSTRY; MANUFACTURE; MATHEMATICAL MODELS; NEURAL NETWORKS; OBJECT ORIENTED PROGRAMMING; PERFORMANCE; TESTING;

SEMICONDUCTOR MATERIALS;

EID: 29644447717     PISSN: 09537287     EISSN: 13665871     Source Type: Journal    
DOI: 10.1080/09537280500213757     Document Type: Article

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