Analysis of the non linear domain wall response in ferroelectric thin films

Ferroelectrics

Volumn 303, Issue , 2004, Pages 59-63

  Bharadwaja, S S N ^a   Damjanovic, D ^a   Setter, N ^a  

^a Ceramics Laboratory   (Switzerland)

Author keywords

Dielectric relaxation; Ferroelectric; Nonlinearity; Thin films

Indexed keywords

DIELECTRIC RELAXATION; FREQUENCY AGILITY; NONLINEAR SYSTEMS; PARAMETER ESTIMATION; PERMITTIVITY; THIN FILMS;

DIELECTRIC PERMITTIVITY; FIELD AMPLITUDE; NONLINEARITY; RAYLEIGH MODEL;

FERROELECTRIC MATERIALS;

EID: 29644442547     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190490456583     Document Type: Article

References (14)

1. Q. M. Zhang, H. Wang, N. Kim, and L. E. Cross, J. Appl. Phys. 75, 454-459 (1994).
2. Q. M. Zhang, W. Y. Pan, S. J. Jang, and L. E. Cross, J. Appl. Phys. 64, 6445-6451 (1988).
3. S. Trolier-McKinstry, J. F. Shepard Jr., J. L. Lacey, T. Su, G. Zavala, and J. Fendler, Ferroelectrics 206-207, 381-392 (1998).
4. D. V. Taylor and D. Damjanovic, Appl. Phys. Lett. 73, 2045-2047 (1998).
5. D. V. Taylor and D. Damjanovic, J. Appl. Phys. 82, 1973-1975 (1997).
6. D. V. Taylor, D. Damjanovic, and N. Setter, Ferroelectrics 224, 299-306 (1999).
7. D. Damjanovic, Phys. Rev. B 55, R649-R652 (1997).
8. D. Damjanovic, J. Appl. Phys. 82, 1788-1797 (1997).
9. T. Nattermann, Y. Shapir, and I. Vilfan, Phys. Rev. B 42, 8577-8586 (1990).
10. W. Kleemann, J. Dec, S. Miga, T. Woike, and R. Pankrath, Phys. Rev. B 65, 220101 (2002).
11. V. Mueller, Y. Shchur, H. Beige, A. Fuith, and S. Stepanow, Europhysics Letters 57, 107-112 (2002).
12. V. Mueller, Y. Shchur, and H. Beige, Ferroelectrics 269, 201-206 (2002).
13. A. V. Shil'nikov, N. M. Galiyarova, S. V. Gorin, D. G. Vasil'ev, and L. K. Vologirova, Izv. Akad. Nauk SSSR. Ser. Fiz. 55, 578-582 (1991).
14. Y. Park, Solid State Comm. 113, 379-383 (2000).