Effect of surface bond-order loss on electrical resistivity of metallic polycrystalline thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 72, Issue 15, 2005, Pages

  Yeung, T C Au ^a   Chiam, T C ^a   Chen, C K ^a   Sun, C Q ^a   Shangguan, W Z ^a   Wong, W K ^a   Kam, C H ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 29644440740     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.155417     Document Type: Article

References (13)

1. E. H. Sondheimer, Adv. Phys. ADPHAH 0001-8732 1, 1 (1952).
2. S. Soffer, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1709746 38, 1710 (1967).
3. A. F. Mayadas, M. Shatzkes, and J. Janak, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1652680 14, 345 (1969).
4. A. Mayadas and M. Shatzkes, Phys. Rev. B PLRBAQ 0556-2805 10.1103/PhysRevB.1.1382 1, 1382 (1970).
5. D. Schumacher, Thin Solid Films THSFAP 0040-6090 10.1016/0040-6090(87) 90266-5 152, 499 (1987).
6. J. Sambles, K. Elsom, and D. Jarvis, Philos. Trans. R. Soc. London, Ser. A PTRMAD 0962-8428 304, 365 (1982).
7. G. Kästle, H.-G. Boyen, A. Schröder, A. Plettl, and P. Ziemann, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.70.165414 70, 165414 (2004).
8. C. Q. Sun, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.69.045105 69, 045105 (2004).
9. T. C. Au-Yeung, C. Q. Sun, T. C. Chiam, R. Ramanathan, W. Z. Shangguan, and C. H. Kam, J. Appl. Phys. JAPIAU 0021-8979 (to be published).
10. J. W. C. De Vries, Thin Solid Films THSFAP 0040-6090 10.1016/0040- 6090(88)90478-6 167, 25 (1988);
11. J. W. C. De Vries, J. Phys. F: Met. Phys. JPFMAT 0305-4608 10.1088/0305-4608/17/9/019 17, 1945 (1987).
12. J. W. C. De Vries, J. Phys. F: Met. Phys. JPFMAT 0305-4608 10.1088/0305-4608/17/12/014 17, 2403 (1987).
13. M. Fenn, G. Akuetey, and P. E. Donovan, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/10/8/007 10, 1707 (1998).