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Volumn 72, Issue 24, 2005, Pages

Composition dependence of the infrared dielectric functions in Si-doped hexagonal AlxGa1-xN films on c-plane sapphire substrates

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EID: 29644440665     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.245326     Document Type: Article
Times cited : (23)

References (34)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.