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Volumn 72, Issue 16, 2005, Pages

Current and noise expressions for radio-frequency single-electron transistors

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EID: 29644435010     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.165348     Document Type: Article
Times cited : (7)

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