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Volumn 68, Issue 6, 2001, Pages 55-57
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Image analysis for materials testing
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 29544441241
PISSN: 00198374
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (4)
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