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Volumn 18, Issue 1, 2006, Pages 79-88
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Capability indices and conformance to specification: The motivation for using Cpm
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Author keywords
risk; risk; Capability indices; Cost of poor quality (COPQ); Cpk; Cpm; Critical to quality (CTQ); Defect; Defective; Design for Six Sigma (DFSS); Design specification; Key characteristic (KC); Process capability; Quadratic loss; Root sum squares (RSS); Six Sigma; Specification limits; Statistical design methods (SDM); Taguchi; Tolerances
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Indexed keywords
APPROXIMATION THEORY;
CUSTOMER SATISFACTION;
NORMAL DISTRIBUTION;
PROCESS ENGINEERING;
PRODUCT DESIGN;
RANDOM PROCESSES;
SPECIFICATIONS;
STATISTICAL METHODS;
TRANSFER FUNCTIONS;
CAPABILITY INDICES;
COST OF POOR QUALITY (COPQ);
CRITICAL TO QUALITY (CTQ);
DESIGN FOR SIX SIGMA (DFSS);
DESIGN SPECIFICATION;
KEY CHARACTERISTIC (KC);
PROCESS CAPABILITY;
ROOT SUM SQUARE;
STATISTICAL DESIGN METHOD (SDM);
QUALITY ASSURANCE;
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EID: 29544440459
PISSN: 08982112
EISSN: 15324222
Source Type: Journal
DOI: 10.1080/08982110500406469 Document Type: Article |
Times cited : (8)
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References (10)
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