Factors affecting TCLP lead leachability from computer CPUs

Waste Management

Volumn 26, Issue 3, 2006, Pages 293-298

  Vann, Kevin N ^a,b   Musson, Stephen E ^a   Townsend, Timothy G ^a  

^a UNIVERSITY OF FLORIDA   (United States)

^b Camp Dresser and McKee   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMISTRY; GALVANIZED METAL; LEAD; MIXTURES; PROGRAM PROCESSORS; STEEL; TOXICITY;

CENTRAL PROCESSING UNITS (CPUS); LEAD LEACHING; SIZE REDUCTION; TOXICITY CHARACTERISTIC LEACHING PROCEDURE (TCLP);

LEACHING;

IRON; LEAD; METAL; STEEL; ZINC;

WASTE MANAGEMENT;

ARTICLE; CENTRAL PROCESSING UNIT; COMPUTER; COMPUTER SYSTEM; CONCENTRATION (PARAMETERS); ELECTROCHEMISTRY; HAZARDOUS WASTE; LEACHING; MATERIALS; PREDICTION; PRIORITY JOURNAL; SOLUBILITY; TOXICITY;

ACETIC ACID; COMPUTERS; IRON; LEAD; SODIUM HYDROXIDE; WASTE PRODUCTS; WATER POLLUTANTS, CHEMICAL; ZINC;

EID: 29444459151     PISSN: 0956053X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wasman.2005.06.016     Document Type: Article

References (13)

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