Raman study of the phase transition in VO2 thin films

Journal of Crystal Growth

Volumn 268, Issue 1-2, 2004, Pages 178-183

  Pan, Mei ^a   Liu, Jie ^a   Zhong, Hongmei ^a   Wang, Shaowei ^a   Li, Zhi Feng ^a   Chen, Xiaoshuang ^a   Lu, Wei ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

A1. Phase transition; A1. Raman spectra; A3. Vanadium dioxide thin films

Indexed keywords

OXYGEN; PHONONS; RAMAN SCATTERING; SEMICONDUCTOR MATERIALS; SIZE DETERMINATION; THIN FILMS; VANADIUM COMPOUNDS;

HYSTERETIC LOOPS; PHONON MODES; SIZE DISTRIBUTION; VANADIUM DIOXIDE THIN FILMS;

PHASE TRANSITIONS;

EID: 2942756150     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.05.005     Document Type: Article

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