New bit-error-rate monitoring technique based on histograms and curve fitting

Optics Express

Volumn 12, Issue 11, 2004, Pages 2507-2511

  Ding, Lei ^a   Zhong, Wen De ^a   Lu, Chao ^b   Wang, Yixin ^b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b INSTITUTE FOR INFOCOMM RESEARCH   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK; FUNCTIONS; GAUSSIAN NOISE (ELECTRONIC); MATHEMATICAL MODELS; NONLINEAR OPTICS; OPTICAL COMMUNICATION; WAVELENGTH DIVISION MULTIPLEXING;

NON-LINEAR OPTICAL EFFECTS; OPTICAL CHANNELS; SIGNAL QUALITY; WAVEFORM DISTORTION;

BIT ERROR RATE;

EID: 2942737001     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OPEX.12.002507     Document Type: Article

References (11)

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