Study on pyrite FeS2 films deposited on Si(1 0 0) substrate by synchrotron radiation surface X-ray diffraction method

Journal of Crystal Growth

Volumn 268, Issue 1-2, 2004, Pages 222-226

  Wan, Dongyun ^a   He, Qing ^a   Zhang, Lipeng ^b   Jia, Quanjie ^a   Zhang, Rengang ^a   Zhang, Hui ^a   Wang, Baoyi ^a   Wei, Long ^a  

^a INSTITUTE OF HIGH ENERGY PHYSICS   (China)

^b SHANDONG UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

A1. Synchrotron radiation surface X ray diffraction; B1. Iron pyrite films; B2. Semiconducting materials

Indexed keywords

CRYSTAL STRUCTURE; IRON COMPOUNDS; MAGNETRON SPUTTERING; PHOTOVOLTAIC EFFECTS; SEMICONDUCTOR MATERIALS; SILICON; STRUCTURAL ANALYSIS; SUBSTRATES; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

BEIJING SYNCHROTON RADIATION FACILITY (BSRF); IRON PYRITE FILMS; SI SUBSTRATE; SYNCHROTON RADIATION SURFACE X-RAY DIFFRACTION;

METALLIC FILMS;

EID: 2942722773     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.05.014     Document Type: Article

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