Operating characteristic curves for the exponential bayes-truncated test

Quality and Reliability Engineering International

Volumn 20, Issue 4, 2004, Pages 337-342

  Wang, Fu Kwun ^a   Keats, J Bert ^b  

^a NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^b Arizona State University   (United States)

Author keywords

Batch testing; Exponential distribution; Operating characteristic curve; Sequential testing; Truncated test

Indexed keywords

APPROXIMATION THEORY; COMPUTATIONAL METHODS; CONSUMER PRODUCTS; ERROR ANALYSIS; PROBABILITY; RELIABILITY;

BATCH TESTING; EXPONENTIAL DISTRIBUTION; OPERATING CHARACTERISTIC CURVE; SEQUENTIAL TESTING; TRUNCATED TEST;

RISK MANAGEMENT;

EID: 2942707802     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.546     Document Type: Article

References (4)

1. Deely JJ, Keats JB. Bayes stopping rules for reliability testing with the exponential distribution. IEEE Transactions on Reliability 1994; 43:288-293.
2. Wang FK, Keats JB, Leu BY. Bayesian stopping rule for normal distribution. International Journal of Industrial Engineering, at press.
3. Ferris CD, Grubbs FE, Weaver CL. Operating characteristics for the common statistical tests of significance. Annals of Mathematical Statistics 1946; 17:178-197.
4. Kececioglu D. Reliability and Life Testing Handbook, vol. 2. Prentice-Hall: New York, 1994.