Lifetime acceleration model for HAST tests of a pHEMT process

Microelectronics Reliability

Volumn 44, Issue 7, 2004, Pages 1039-1045

  Ersland, Peter ^a   Jen, Hei Ruey ^a   Yang, Xinxing ^a  

^a M/A COM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATION; ACTIVATION ENERGY; ATMOSPHERIC HUMIDITY; ELECTRIC SWITCHES; ELECTRON MOBILITY; FAILURE ANALYSIS; GATES (TRANSISTOR); SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING SILICON; STATISTICAL METHODS;

FAILURE DISTRIBUTIONS; HIGHLY ACCELERATED STRESS TESTING (HAST); STRESS ACCELERATION;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 2942705841     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.03.009     Document Type: Conference Paper

References (3)

1. Highly-Accelerated Temperature and Humidity Stress Test (HAST), JEDEC Standard Test Method JESD22-A110-B, 1999.
2. Peck DS. Comprehensive model for humidity testing correlation. International Reliability Physics Symposium, 1986, p. 44-50.
3. Hallberg O., Peck D.S. Recent humidity accelerations, a base for testing standards. Qual. Reliab. Eng. Int. 7:1991;169-180.