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Journal of Applied Physics

Volumn 95, Issue 11 II, 2004, Pages 6762-6764

Thickness dependence of magneto-transport in Cu-Co granular thin films

(4) Wang, Jian Qing a Dao, NgocNga b Kim, Nam H a Whittenburg, Scott L c

a BINGHAMTON UNIVERSITY (United States)

b UNIVERSITY OF TWENTE (Netherlands)

c UNIVERSITY OF NEW ORLEANS (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DC MAGNETRON SPUTTERING; EXTRAORDINARY HALL EFFECTS (EHE); MAGNETO-TRANSPORT PROPERTIES; SURFACE SCATTERING;

CARRIER CONCENTRATION; GIANT MAGNETORESISTANCE; GRANULAR MATERIALS; HALL EFFECT; INTERPOLATION; MAGNETIC MATERIALS; MAGNETIC RECORDING; MAGNETIZATION; MAGNETOMETERS; MAGNETRON SPUTTERING; MICROSTRUCTURE; OXIDATION; SILICON WAFERS; SQUIDS; THICKNESS MEASUREMENT; THIN FILMS;

COPPER COMPOUNDS;

EID: 2942696341 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1664171 Document Type: Conference Paper

Times cited : (11)

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