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Volumn 39, Issue 6, 2004, Pages 927-933

90% Write power-saving SRAM using sense-amplifying memory cell

Author keywords

Leakage current; Low power; Reduced swing; Sense amplifying cell; SRAM; Write power

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ENERGY UTILIZATION; LEAKAGE CURRENTS; MATHEMATICAL MODELS; POWER ELECTRONICS; PROBLEM SOLVING;

EID: 2942691849     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2004.827793     Document Type: Article
Times cited : (71)

References (11)
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    • Reviews and prospects of low-power memory circuits
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    • Kanda, K.1    Miyazaki, T.2    Min, K.S.3    Kawaguchi, H.4    Sakurai, T.5
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    • Row-by-row dynamic source-line voltage control (RRDSV) scheme for two orders of magnitude leakage current reduction of sub-1-V-VDD SRAMs
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    • K. S. Min, K. Kanda, and T. Sakurai, " Row-by-row dynamic source-line voltage control (RRDSV) scheme for two orders of magnitude leakage current reduction of sub-1-V-VDD SRAMs," in Proc. Int. Symp. Low-Power Electronics and Design, Aug. 2003, pp. 66-71.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.